JEOL JSM-IT800i
DESCRIPTION
Schottky field emission electron microscopy system
0.01–30 keV
resolution 0.7 nm @1.0 kV
Beam-Deceleration mode
suitable for large samples up to 150 mm in diameter
Schottky field emission electron microscopy system
0.01–30 keV
resolution 0.7 nm @1.0 kV
Beam-Deceleration mode
suitable for large samples up to 150 mm in diameter