Tip and sample scanning nanoscopy for optical, electrical, and mechanical property measurements   The microscope is integrated onto Zeiss Axio Observer 5 and requires transparent sample for optical measurements and for observing the sample and target area.  Available scanning probe methods include Atomic Force Microscopy (AFM), Conductive AFM, Kelvin Force Probe Microscopy, Scanning Tunneling microscope, Tuning-Fork based Aperture-Tip Scanning Near-Field Microscopy (SNOM), and Apertureless-Tip scattering-SNOM etc.  AFM scanning modes include tapping mode, contact mode, intermediate mode, peak-force mode, and QI (Quantitative Imaging) mode which acquires 3 dimensional height-force map and is suited for samples that are very soft or with stark height variations.  Integrated with excitation lasers at 635 nm (CW), 531 nm (ps pulsed), 450 nm (CW), and other laser can be added on demand.  Spatial resolutions can reach as low as 20 nm. Optical resolution with apertureless tips is about the tip apex size, and with aperture tips, it is ~200 nm. For TCPSC measurements, the time resolution is about 200 ps depending on the pulsed laser wavelengths and pulse width, with a time tagger Qutool Qutag (~1 ps) and IDQ SPADs (~50 ps).  Spectral measurements are possible with Horiba iHR320 spectrometer with Synapse EMCCD and with gratings 1200 l/mm @ 630 nm, 300 l/mm @ 630 nm, and 900 l/mm @ 850 nm.